Detecting defects in tomorrow’s technology | Newswise: News for Journalists

Credit: Illustration: Kyle Palmer / PPPL Communications Department (CC BY)

An artist’s depiction of a missing chalcogen atom in the middle layer of a bulk transition-metal dichalcogenide.

« Detecting defects in tomorrow’s technology

Credit: Image credit: Shoaib Khalid, Bharat Medasani and Anderson Janotti / PPPL and the University of Delaware

This model shows the spot where the missing chalcogen atoms should be, as represented by the black circle in the center of an otherwise undisturbed pattern of atoms. This view looks down on the middle layer of the TMD.

« Detecting defects in tomorrow’s technology

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